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本文介紹了一種使用 ICP-OES 準(zhǔn)確測(cè)定電池級(jí)硫酸錳中雜質(zhì)元素的方法。該方法具有出色的檢測(cè)限、準(zhǔn)確度和穩(wěn)定性，滿足雜質(zhì)元素的分析要求，且分析速度和效率優(yōu)于傳統(tǒng)分析方法。
Agilent 5100 ICP-OES 徹底變革了 ICP-OES 分析。5100 SVDV 擁有獨(dú)特的智能光譜組合
了解垂直炬管的優(yōu)勢(shì) — 快速提供準(zhǔn)確結(jié)果，輕松應(yīng)對(duì)復(fù)雜樣品
使用微型 ATR FTIR 成像系統(tǒng)在電子和半導(dǎo)體行業(yè)中進(jìn)行無(wú)損故障/缺陷分析應(yīng)用簡(jiǎn)報(bào)
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| 文件出版號(hào) | 5990-9961EN | |||||
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Laboratory setup and configuration requirements
Application note for Performance of compact visual displays — measuring angular reflectance of optically active materials using the Agilent Cary 7000 Universal Measurement Spe
The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis. Learn how SVDV works with unique Dichroic Spectral combiner technology.
Agilent’s Fitted Background Correction (FBC) takes the guesswork out of background correction. No matter what your sample challenge may be.
The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis. Learn how SVDV works with unique Dichroic Spectral combiner technology.
In reversed-phase liquid chromatography, pH and ionic strength of the aqueous portion of mobile phases are important in developing rugged method
Combining signals from two DADs with different path length flow cells, the 1200 Infinity Series HDR-DAD Analyzer enables analysis of main and trace compounds in a single run
Learn about the benefits of a vertically oriented torch—fast, accurate results, even for your toughest samples
Application note for monitoring heavy metals by atomic absorption spectroscopy for compliance with RoHS and WEEE Directives
This Technical Overview describes a LC system with 3 detectors in a multi-user environment operated with Agilent MassHunter Walkup Software for LC/MS and LC systems.
安捷倫科技從未停止對(duì)更快、更智能的 CCD 檢測(cè)器系列的創(chuàng)新和研發(fā)。
Detailing methods and practices of FT-IR microscopy and imaging for failure analysis in electronics manufacturing.
Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples
| 文件出版號(hào) | 5990-6195EN | ||
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Application note for the analysis of electroceramics using laser ablation ICP-MS
Agilent’s proprietary Fast Automated Curve-fitting Technique (FACT) provides accurate background correction, enabling you to analyze spectrally complex samples with confidence