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應(yīng)用的篩選條件
本文介紹了一種使用 ICP-OES 準(zhǔn)確測(cè)定電池級(jí)硫酸錳中雜質(zhì)元素的方法。該方法具有出色的檢測(cè)限、準(zhǔn)確度和穩(wěn)定性，滿足雜質(zhì)元素的分析要求，且分析速度和效率優(yōu)于傳統(tǒng)分析方法。
Agilent 5100 ICP-OES 徹底變革了 ICP-OES 分析。5100 SVDV 擁有獨(dú)特的智能光譜組合
分子光譜培訓(xùn)講座 — 硬件。
無論何時(shí)訪問安捷倫在線商店，您都能夠輕松體驗(yàn)方便快捷的訂購(gòu)功能。5步教程
了解垂直炬管的優(yōu)勢(shì) — 快速提供準(zhǔn)確結(jié)果，輕松應(yīng)對(duì)復(fù)雜樣品
使用微型 ATR FTIR 成像系統(tǒng)在電子和半導(dǎo)體行業(yè)中進(jìn)行無損故障/缺陷分析應(yīng)用簡(jiǎn)報(bào)
| 英語 (美國(guó)) | 完整版（PDF） |
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Agilent 5100 同步垂直雙向觀測(cè) (SVDV) ICP-OES 顛覆了傳統(tǒng)雙向觀測(cè) ICP-OES概念。5100 SVDV ICP-OES 憑借獨(dú)特的智能光譜組合技術(shù) (DSC) 一次測(cè)量完成水平和垂直信號(hào)的同步采集讀取，實(shí)現(xiàn)高速高效的樣品分析，確保復(fù)雜基質(zhì)樣品的分析準(zhǔn)確度。
| 文件出版號(hào) | 5990-9961EN | |||||
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| 分析技術(shù) | 技術(shù) |
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| 樣品 | 化學(xué)基團(tuán) |
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Laboratory setup and configuration requirements
Application note for Performance of compact visual displays — measuring angular reflectance of optically active materials using the Agilent Cary 7000 Universal Measurement Spe
A guide to measuring trace elements and metal contaminants in semiconductor fabrication
Learn the reasons why the Agilent 7900s single quadrupole ICP-MS is ideal for measuring contaminants in semiconductor manufacturing chemicals
Atomic spectroscopy training presentation - hardware.
The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis. Learn how SVDV works with unique Dichroic Spectral combiner technology.
Agilent’s Fitted Background Correction (FBC) takes the guesswork out of background correction. No matter what your sample challenge may be.
The Agilent 5100 Synchronous Vertical Dual (SVDV) revolutionizes ICP-OES analysis. Learn how SVDV works with unique Dichroic Spectral combiner technology.
In reversed-phase liquid chromatography, pH and ionic strength of the aqueous portion of mobile phases are important in developing rugged method
Combining signals from two DADs with different path length flow cells, the 1200 Infinity Series HDR-DAD Analyzer enables analysis of main and trace compounds in a single run